Analytical model of the trap-density-dependent programming characteristics of MONOS memories and its application to a MONS memory

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Analytical model of the trap-density-dependent programming characteristics of MONOS memories and its application to a MONS memory

Call No. (NDL)
Z16-940
Bibliographic ID of National Diet Library
6086389
Material type
記事
Author
野本 和正ほか
Publisher
東京 : 電子情報通信学会
Publication date
2002-01-22
Material Format
Paper
Journal name
電子情報通信学会技術研究報告 = IEICE technical report : 信学技報 101(573) 2002.1.22
Publication Page
p.49~54
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Paper

Material Type
記事
Author/Editor
野本 和正
藤原 一郎
青笹 浩 他
Alternative Title
MONOSメモリのトラップ密度に依存したプログラム特性の解析モデルとMONSメモリへの応用
Periodical title
電子情報通信学会技術研究報告 = IEICE technical report : 信学技報
No. or year of volume/issue
101(573) 2002.1.22
Volume
101
Issue
573
Pages
49~54