@prefix rdf: <http://www.w3.org/1999/02/22-rdf-syntax-ns#>.
@prefix rdfs: <http://www.w3.org/2000/01/rdf-schema#>.
@prefix owl: <http://www.w3.org/2002/07/owl#>.
@prefix skos: <http://www.w3.org/2004/02/skos/core#>.
@prefix xl: <http://www.w3.org/2008/05/skos-xl#>.
@prefix rdag1: <http://RDVocab.info/ElementsGr1/>.
@prefix rda: <http://RDVocab.info/ElementsGr2/>.
@prefix rdaa: <http://rdaregistry.info/Elements/a/>.
@prefix frbrent: <http://RDVocab.info/uri/schema/FRBRentitiesRDA/>.
@prefix foaf: <http://xmlns.com/foaf/0.1/>.
@prefix ndl: <http://ndl.go.jp/dcndl/terms/>.
@prefix dct: <http://purl.org/dc/terms/>.

<http://id.ndl.go.jp/auth/ndlna/001164613>
	foaf:primaryTopic <http://id.ndl.go.jp/auth/entity/001164613>;
	rdf:type <http://www.w3.org/2004/02/skos/core#Concept>;
	dct:modified "2014-04-04T11:40:10";
	dct:created "2014-04-02";
	xl:prefLabel [xl:literalForm "寒川, 誠二";ndl:transcription "サムカワ, セイジ"@ja-Kana,"Samukawa, Seiji"@ja-Latn];
	rdfs:label "寒川, 誠二";
	xl:altLabel [xl:literalForm "Samukawa, Seiji"];
	dct:source "Feature profile evolution in plasma processing using on-wafer monitoring system, c2014","名称は推量";
	skos:exactMatch <http://viaf.org/viaf/sourceID/NDL%7C001164613#skos:Concept>;
	skos:inScheme <http://id.ndl.go.jp/auth#personalNames>.

<http://id.ndl.go.jp/auth/entity/001164613>
	rdf:type <http://xmlns.com/foaf/0.1/Person>;
	foaf:name "寒川誠二";
	rda:biographicalInformation "大学教員".