@prefix rdf: <http://www.w3.org/1999/02/22-rdf-syntax-ns#>.
@prefix rdfs: <http://www.w3.org/2000/01/rdf-schema#>.
@prefix owl: <http://www.w3.org/2002/07/owl#>.
@prefix skos: <http://www.w3.org/2004/02/skos/core#>.
@prefix xl: <http://www.w3.org/2008/05/skos-xl#>.
@prefix rdag1: <http://RDVocab.info/ElementsGr1/>.
@prefix rda: <http://RDVocab.info/ElementsGr2/>.
@prefix rdaa: <http://rdaregistry.info/Elements/a/>.
@prefix frbrent: <http://RDVocab.info/uri/schema/FRBRentitiesRDA/>.
@prefix foaf: <http://xmlns.com/foaf/0.1/>.
@prefix ndl: <http://ndl.go.jp/dcndl/terms/>.
@prefix dct: <http://purl.org/dc/terms/>.

<http://id.ndl.go.jp/auth/ndlsh/00573056>
	rdf:type <http://www.w3.org/2004/02/skos/core#Concept>;
	dct:modified "2022-05-24T13:42:05";
	dct:created "1980-06-20";
	xl:prefLabel [xl:literalForm "知能検査";ndl:transcription "Chinokensa"@ja-Latn,"チノウケンサ"@ja-Kana];
	rdfs:label "知能検査";
	xl:altLabel [xl:literalForm "Intelligence tests"],[xl:literalForm "知能テスト";ndl:transcription "Chinotesuto"@ja-Latn,"チノウテスト"@ja-Kana];
	dct:source "B式智能検査法指針 / 田中寛一 著";
	skos:exactMatch <http://id.ndl.go.jp/auth/bsh4/00678300>;
	skos:inScheme <http://id.ndl.go.jp/auth#topicalTerms>;
	owl:sameAs <http://id.ndl.go.jp/auth/ndlsh/知能検査>;
	skos:relatedMatch <http://id.ndl.go.jp/class/ndlc/SB215>,<http://id.ndl.go.jp/class/ndc9/371.7>,<http://id.ndl.go.jp/class/ndc10/371.7>;
	skos:note "地理区分 (20220524-)";
	skos:broader <http://id.ndl.go.jp/auth/ndlsh/00568694>,<http://id.ndl.go.jp/auth/ndlsh/00570407>;
	skos:closeMatch <http://id.loc.gov/authorities/subjects/sh85067180>;
	skos:related <http://id.ndl.go.jp/auth/ndlsh/01011635>,<http://id.ndl.go.jp/auth/ndlsh/00573055>.

<http://id.ndl.go.jp/auth/ndlsh/00568694> rdfs:label "能力テスト".
<http://id.ndl.go.jp/auth/ndlsh/00570407> rdfs:label "心理検査".
<http://id.ndl.go.jp/auth/ndlsh/01011635> rdfs:label "発達検査".
<http://id.ndl.go.jp/auth/ndlsh/00573055> rdfs:label "知能".