Bibliographic Record
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- Material Type
- 記事
- Author/Editor
- 村松 徹葛西 誠也谷田部 然治
- Series Title
- Alternative Title
- Characterization and Analysis of Low-Frequency Noise in SiN Insulator-Gate GaAs Etched Nanowire FETs
- Periodical title
- 電子情報通信学会技術研究報告 = IEICE technical report : 信学技報
- No. or year of volume/issue
- 111(426):2012.2.7・8
- Volume
- 111
- Issue
- 426