Holdings of Libraries in Japan
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Bibliographic Record
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- Material Type
- 記事
- Author/Editor
- 橋爪 正樹小西 朝陽四柳 浩之
- Series Title
- Alternative Title
- Electrical Testable Design for Open Defects at Logic Signal Lines between Dies in 3D ICs
- Periodical title
- 電子情報通信学会論文誌. C, エレクトロニクス = The IEICE transactions on electronics. C / 電子情報通信学会 編
- No. or year of volume/issue
- 96(11)=551:2013.11
- Volume
- 96
- Issue
- 11