Microstructure of Erbium Oxide Thin Film on SUS316 Substrate with Y₂O₃ or CeO₂ Buffer Layers Formed by MOCVD Method
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- Material Type
- 記事
- Author/Editor
- Seungwon LeeTakayuki ShinkawaKenji MatsudaMasaki TanakaYoshimitsu HishinumaKatsuhiko NishimuraTeruya TanakaTakeo MurogaTakahiro Sato
- Author Heading
- Periodical title
- Materials transactions
- No. or year of volume/issue
- 58(2):2017.2
- Volume
- 58
- Issue
- 2
- Pages
- 231-235
- Publication date of volume/issue (W3CDTF)
- 2017-02