Improved transformation of φ-divergence goodness-of-fit test statistics based on minimum φ*-divergence estimator for GLIM of binary data
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- Material Type
- 記事
- Author/Editor
- Nobuhiro TaneichiYuri SekiyaJun Toyama
- Author Heading
- Periodical title
- SUT journal of Mathematics
- No. or year of volume/issue
- 52(2):2016
- Volume
- 52
- Issue
- 2
- Pages
- 193-214
- Publication date of volume/issue (W3CDTF)
- 2016