高エネルギーX線コン...

高エネルギーX線コンプトン散乱法による実用デバイス内部における量子状態の反応下3次元分析 (特集 ナノスケール3次元分析の最前線)

Icons representing 記事

高エネルギーX線コンプトン散乱法による実用デバイス内部における量子状態の反応下3次元分析(特集 ナノスケール3次元分析の最前線)

Call No. (NDL)
Z16-474
Bibliographic ID of National Diet Library
029402712
Material type
記事
Author
鈴木 宏輔ほか
Publisher
東京 : 日本表面科学会 ; 2018-
Publication date
2018-12
Material Format
Paper
Journal name
表面と真空 = Vacuum and surface science / 日本表面科学会, 日本真空学会 編 61(12):2018.12
Publication Page
p.790-796
View All

Holdings of Libraries in Japan

This page shows libraries in Japan other than the National Diet Library that hold the material.

Please contact your local library for information on how to use materials or whether it is possible to request materials from the holding libraries.

other

  • CiNii Research

    Search Service
    Digital
    You can check the holdings of institutions and databases with which CiNii Research is linked at the site of CiNii Research.

Bibliographic Record

You can check the details of this material, its authority (keywords that refer to materials on the same subject, author's name, etc.), etc.

Paper Digital

Material Type
記事
Author/Editor
鈴木 宏輔
櫻井 浩
Alternative Title
In-operando Three-Dimensional Measurement of Quantum State in the Practical Devices Using High-energy X-ray Compton Scattering Spectroscopy
Periodical title
表面と真空 = Vacuum and surface science / 日本表面科学会, 日本真空学会 編
No. or year of volume/issue
61(12):2018.12
Volume
61
Issue
12