MOSトランジスタの...

MOSトランジスタのスケーリングに伴う特性ばらつき (小特集 CMOSデバイスの微細化に伴う特性ばらつきの増大とその対策)

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MOSトランジスタのスケーリングに伴う特性ばらつき(小特集 CMOSデバイスの微細化に伴う特性ばらつきの増大とその対策)

Call No. (NDL)
Z16-192
Bibliographic ID of National Diet Library
10328308
Material type
記事
Author
平本 俊郎ほか
Publisher
東京 : 電子情報通信学会
Publication date
2009-06
Material Format
Digital
Journal name
電子情報通信学会誌 = The journal of the Institute of Electronics, Information and Communication Engineers 92(6) (通号 1021) 2009.6
Publication Page
p.416~426
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Digital

Material Type
記事
Author/Editor
平本 俊郎
竹内 潔
西田 彰男
Alternative Title
Variability of characteristics in scaled MOSFETs
Periodical title
電子情報通信学会誌 = The journal of the Institute of Electronics, Information and Communication Engineers
No. or year of volume/issue
92(6) (通号 1021) 2009.6
Volume
92
Issue
6