NEアカデミー 動かないインタフェース対策の勘所(第1回)規格認証試験に潜むリスク、互換性確保がカギに
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- Material Type
- 記事
- Author/Editor
- 大原 稔
- Author Heading
- Alternative Title
- NE academy: Key points for troubleshooting malfunctioning interfaces (part 1)
- Periodical title
- 日経エレクトロニクス = Nikkei electronics : sources of innovation
- No. or year of volume/issue
- (1054) 2011.4.18
- Issue
- 1054
- Pages
- 100～104
- Publication date of volume/issue (W3CDTF)
- 2011-04-18