金属/GeO2界面における化学結合状態の光電子分光分析 (シリコン材料・デバイス)

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金属/GeO2界面における化学結合状態の光電子分光分析(シリコン材料・デバイス)

Call No. (NDL)
Z16-940
Bibliographic ID of National Diet Library
11200224
Material type
記事
Author
松井 真史ほか
Publisher
東京 : 電子情報通信学会
Publication date
2011-07-04
Material Format
Paper
Journal name
電子情報通信学会技術研究報告 = IEICE technical report : 信学技報 111(114) 2011.7.4
Publication Page
p.63~68
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Paper Digital

Material Type
記事
Author/Editor
松井 真史
藤岡 知宏
大田 晃生 他
Alternative Title
Photoemission study of chemical bonding features at metal/GeO2 interfaces
Periodical title
電子情報通信学会技術研究報告 = IEICE technical report : 信学技報
No. or year of volume/issue
111(114) 2011.7.4
Volume
111
Issue
114