固体内のイオン・電子変位の直接測定--変調X線回折法 (半導体-1-<〔応用物理〕創刊50周年記念特集号> ; 最新の評価技術)
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- Material Type
- 記事
- Author/Editor
- 藤本 勲
- Series Title
- Author Heading
- Periodical title
- 応用物理
- No. or year of volume/issue
- 51(2) 1982.02
- Volume
- 51
- Issue
- 2
- Pages
- p215～220