Imaging of Transition Radiation from Thin Films on a Silicon Substrate Using a Light Detection System Combined with TEM (Special Issue:Structure Analysis by Using nm-Sized Electron Probe Techniques and Advanced Electron Microscopy)

Imaging of Transition Radiation from Thin Films on a Silicon Substrate Using a Light Detection System Combined with TEM

(Special Issue:Structure Analysis by Using nm-Sized Electron Probe Techniques and Advanced Electron Microscopy)

Call No. (NDL): Z53-T76
Bibliographic ID of National Diet Library: 3951123

Material type: 記事

Author: Naoki Yamamotoほか

Publisher: Oxford : Published for the Japanese Society of Electron Microscopy by Oxford University Press

Publication date: 1996

Material Format: Paper

Journal name: Journal of electron microscopy 45(1) 1996

Publication Page: p.64～72

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Paper

Material Type: 記事
Title: Imaging of Transition Radiation from Thin Films on a Silicon Substrate Using a Light Detection System Combined with TEM
Author/Editor: Naoki Yamamoto
Akio Toda
Katsuhiro Araya
Series Title: Special Issue:Structure Analysis by Using nm-Sized Electron Probe Techniques and Advanced Electron Microscopy
Author Heading: Naoki Yamamoto
Akio Toda
Katsuhiro Araya
Periodical title: Journal of electron microscopy
No. or year of volume/issue: 45(1) 1996
Volume: 45
Issue: 1
Pages: 64～72
Publication date of volume/issue (W3CDTF): 1996
ISSN (Periodical Title): 0022-0744
Publication (Periodical Title): Oxford : Published for the Japanese Society of Electron Microscopy by Oxford University Press
Place of Publication (Country Code): GB
Text Language Code: eng
NDLC: ZN33
Target Audience: 一般
Holding library: 国立国会図書館
Call No.: Z53-T76
Data Provider (Database): 国立国会図書館 : 国立国会図書館雑誌記事索引
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 3951123
http://id.ndl.go.jp/bib/3951123
Bibliographic Record Category (NDL): 632