Chemical shift mapping of Si L and K edges using spatially resolved EELS and energy-filtering TEM

Publisher: Oxford : Published for the Japanese Society of Electron Microscopy by Oxford University Press

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Material Type: 記事
Title: Chemical shift mapping of Si L and K edges using spatially resolved EELS and energy-filtering TEM
Author/Editor: Koji Kimoto
Tomoko Sekiguchi
Takashi Aoyama
Author Heading: Koji Kimoto
Tomoko Sekiguchi
Takashi Aoyama
Periodical title: Journal of electron microscopy
No. or year of volume/issue: 46(5) 1997.10
Volume: 46
Issue: 5
Pages: 369～374
Publication date of volume/issue (W3CDTF): 1997-10
ISSN (Periodical Title): 0022-0744
Publication (Periodical Title): Oxford : Published for the Japanese Society of Electron Microscopy by Oxford University Press
Place of Publication (Country Code): GB
Text Language Code: eng
NDLC: ZN33
Target Audience: 一般
Holding library: 国立国会図書館
Call No.: Z53-T76
Data Provider (Database): 国立国会図書館 : 国立国会図書館雑誌記事索引
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 4346281
http://id.ndl.go.jp/bib/4346281
Bibliographic Record Category (NDL): 632