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雑誌Journal of electron microscopy
Volume number47(1)-47(6):1998
ArticleProfiling ...

Profiling Ge islands in Si by large angle convergent beam electron diffraction

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Profiling Ge islands in Si by large angle convergent beam electron diffraction

Call No. (NDL)
Z53-T76
Bibliographic ID of National Diet Library
4538462
Material type
記事
Author
D. Chernsほか
Publisher
Oxford : Published for the Japanese Society of Electron Microscopy by Oxford University Press
Publication date
1998-06
Material Format
Paper
Journal name
Journal of electron microscopy 47(3) 1998.06
Publication Page
p.211～215
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Paper

Material Type
記事
Title
Profiling Ge islands in Si by large angle convergent beam electron diffraction
Author/Editor
D. Cherns
A. Hovsepian
W. Jager
Author Heading
D. Cherns
A. Hovsepian
W. Jager
Periodical title
Journal of electron microscopy
No. or year of volume/issue
47(3) 1998.06
Volume
47
Issue
3
Pages
211～215
Publication date of volume/issue (W3CDTF)
1998-06