A TEM study of local non-uniformities in epitaxial 2H-AlN films on Si(111)substrate

Publisher: Oxford : Published for the Japanese Society of Electron Microscopy by Oxford University Press

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Material Type: 記事
Title: A TEM study of local non-uniformities in epitaxial 2H-AlN films on Si(111)substrate
Author/Editor: Ute Kaiser
I.I. Khodos
J. Jinschek 他
Author Heading: Ute Kaiser
I.I. Khodos
J. Jinschek
Periodical title: Journal of electron microscopy
No. or year of volume/issue: 48(5) 1999
Volume: 48
Issue: 5
Pages: 545～554
Publication date of volume/issue (W3CDTF): 1999
ISSN (Periodical Title): 0022-0744
Publication (Periodical Title): Oxford : Published for the Japanese Society of Electron Microscopy by Oxford University Press
Place of Publication (Country Code): GB
Text Language Code: eng
NDLC: ZN33
Target Audience: 一般
Holding library: 国立国会図書館
Call No.: Z53-T76
Data Provider (Database): 国立国会図書館 : 国立国会図書館雑誌記事索引
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 4895070
http://id.ndl.go.jp/bib/4895070
Bibliographic Record Category (NDL): 632