制御継電器での電気接点損傷に関する数値評価研究(その15)AgCdO12wt%電気接点対での開離責務接点の損傷と閉成責務接点の損傷との比較

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制御継電器での電気接点損傷に関する数値評価研究(その15)AgCdO12wt%電気接点対での開離責務接点の損傷と閉成責務接点の損傷との比較

Call No. (NDL)
Z16-940
Bibliographic ID of National Diet Library
5317852
Material type
記事
Author
渡邊 隆志ほか
Publisher
東京 : 電子情報通信学会
Publication date
2000-02-18
Material Format
Paper
Journal name
電子情報通信学会技術研究報告 = IEICE technical report : 信学技報 99 (通号 644) 2000.02.18
Publication Page
p.13~18
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Paper

Material Type
記事
Author/Editor
渡邊 隆志
守永 和史
秋山 健司 他
Periodical title
電子情報通信学会技術研究報告 = IEICE technical report : 信学技報
No. or year of volume/issue
99 (通号 644) 2000.02.18
Volume
99
Sequential issue number
644
Pages
13~18
Publication date of volume/issue (W3CDTF)
2000-02-18