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雑誌表面科学
Volume number24(8) 2003.8
ArticleMn-N化合物薄膜の...

Mn-N化合物薄膜の電子状態密度のXPS測定

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Mn-N化合物薄膜の電子状態密度のXPS測定

Call No. (NDL)
Z15-379
Bibliographic ID of National Diet Library
6673608
Material type
記事
Author
森尾 和正ほか
Publisher
東京 : 日本表面科学会
Publication date
2003-08
Material Format
Digital
Journal name
表面科学 = Journal of the Surface Science Society of Japan / 日本表面科学会 編 24(8) 2003.8
Publication Page
p.480～484
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Detailed bibliographic record

Summary, etc.：

Polycrystalline thin films with an oriented direction of ε-Mn<Sub>4</Sub>N along the (111) axis and of η-Mn<Sub>3</Sub>N<Sub>2</Sub> along the (113) a...

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Digital

Material Type
記事
Title
Mn-N化合物薄膜の電子状態密度のXPS測定
Author/Editor
森尾 和正
小泉 義晴
Author Heading
森尾 和正
小泉 義晴
Periodical title
表面科学 = Journal of the Surface Science Society of Japan / 日本表面科学会 編
No. or year of volume/issue
24(8) 2003.8
Volume
24
Issue
8
Pages
480～484
Publication date of volume/issue (W3CDTF)
2003-08