SnO2 Separative Structure Extended Gate H〔+〕-Ion Sensitive Field Effect Transistor by the Sol-Gel Technology and the Readout Circuit Developed by Source Follower

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SnO2 Separative Structure Extended Gate H〔+〕-Ion Sensitive Field Effect Transistor by the Sol-Gel Technology and the Readout Circuit Developed by Source Follower

Call No. (NDL)
Z53-A375
Bibliographic ID of National Diet Library
6752094
Material type
記事
Author
Jung-Chuan Chouほか
Publisher
Tokyo : Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physics
Publication date
2003-11
Material Format
Digital
Journal name
Japanese journal of applied physics. Part. 1, Regular papers, brief communications & review papers : JJAP 42(11) (通号 585) 2003.11
Publication Page
p.6790~6794
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Detailed bibliographic record

Summary, etc.:

In this study, the tin oxide membrane, fabricated by the sol–gel technology, was used as the pH-sensing layer of the extended gate H<SUP>+</SUP>-ion s...

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Bibliographic Record

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Digital

Material Type
記事
Author/Editor
Jung-Chuan Chou
Pik-Kwan Kwan
Zhi-Jie Chen
Periodical title
Japanese journal of applied physics. Part. 1, Regular papers, brief communications & review papers : JJAP
No. or year of volume/issue
42(11) (通号 585) 2003.11
Volume
42
Issue
11
Sequential issue number
585
Pages
6790~6794