無閉路可検査性に基づくテスト生成のための最適スルー木集合構成法 (VLSI設計技術)

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無閉路可検査性に基づくテスト生成のための最適スルー木集合構成法

(VLSI設計技術)

Call No. (NDL)
Z16-940
Bibliographic ID of National Diet Library
9290885
Material type
記事
Author
森永 広介ほか
Publisher
東京 : 電子情報通信学会
Publication date
2007-11-20
Material Format
Paper
Journal name
電子情報通信学会技術研究報告 = IEICE technical report : 信学技報 107(334) 2007.11.20
Publication Page
p.13~18
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Paper

Material Type
記事
Author/Editor
森永 広介
岡 伸也
吉川 祐樹 他
Series Title
Alternative Title
An optimization of thru trees for test generation based on acyclical testability
Periodical title
電子情報通信学会技術研究報告 = IEICE technical report : 信学技報
No. or year of volume/issue
107(334) 2007.11.20
Volume
107
Issue
334