Volume number17 20070900
論理IC実装時に発生...

論理IC実装時に発生する抵抗を伴うリード浮きに対する電流テスト能力評価

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論理IC実装時に発生する抵抗を伴うリード浮きに対する電流テスト能力評価

Call No. (NDL)
Z16-1617
Bibliographic ID of National Diet Library
9298210
Material type
記事
Author
小野 安季良ほか
Publisher
東京 : エレクトロニクス実装学会
Publication date
2007-09
Material Format
Paper
Journal name
マイクロエレクトロニクスシンポジウム論文集 17 2007.9.13・14
Publication Page
p.195~198
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Paper

Material Type
記事
Author/Editor
小野 安季良
一宮 正博
四柳 浩之 他
Alternative Title
Testability of supply current test method for resistive open lead detection
Periodical title
マイクロエレクトロニクスシンポジウム論文集
No. or year of volume/issue
17 2007.9.13・14
Volume
17
Pages
195~198
Publication date of volume/issue (W3CDTF)
2007-09