Simulation analysis of quantum confinement and short-channel effects in independent double-gate metal-oxide-semiconductor fieldeffect transistors

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Simulation analysis of quantum confinement and short-channel effects in independent double-gate metal-oxide-semiconductor fieldeffect transistors

Call No. (NDL)
Z53-A375
Bibliographic ID of National Diet Library
9651939
Material type
記事
Author
Mathieu Moreauほか
Publisher
Tokyo : The Japan Society of Applied Physics
Publication date
2008-09
Material Format
Digital
Journal name
Japanese journal of applied physics : JJAP 47(9) (1) 2008.9
Publication Page
p.7013~7018
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Digital

Material Type
記事
Author/Editor
Mathieu Moreau
Daniela Munteanu
Jean-Luc Autran
Periodical title
Japanese journal of applied physics : JJAP
No. or year of volume/issue
47(9) (1) 2008.9
Volume
47
Issue
9
Other Volume
1
Pages
7013~7018