多端子型直流電位差法を用いた半楕円背面き裂の位置,寸法,形状と板厚の同時推定に関する電位場解析
Digital data available（Japan Link Center）
Begin reading now
CiNii Research
Holdings of Libraries in Japan
This page shows libraries in Japan other than the National Diet Library that hold the material.
Please contact your local library for information on how to use materials or whether it is possible to request materials from the holding libraries.
other
CiNii Research
Search ServiceDigitalYou can check the holdings of institutions and databases with which CiNii Research is linked at the site of CiNii Research.
Bibliographic Record
You can check the details of this material, its authority (keywords that refer to materials on the same subject, author's name, etc.), etc.
- Material Type
- 記事
- Author/Editor
- 多田 直哉船越 亮内田 真 他
- Alternative Title
- Electric field analysis of the simultaneous evaluation of location, size, and shape of a semi-elliptical crack on the back surface and plate thickness using direct-current potential difference method of multiple-probe type
- Periodical title
- 非破壊検査 : Jjournal of the Japanese Society for Non-destructive Inspection / 日本非破壊検査協会 編
- No. or year of volume/issue
- 57(3) 2008.3
- Volume
- 57
- Issue
- 3
- Pages
- 137～141